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Springer Handbook of Microscopy

John C.H. Spence (Hrsg.), Peter W. Hawkes (Hrsg.)

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ca. 341,33
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Naturwissenschaften, Medizin, Informatik, Technik / Maschinenbau, Fertigungstechnik

Beschreibung

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology.

Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and alsoion microscopy. 

In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

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Schlagwörter

Biological Microscopy, aberration correctons, monochromators, spectrometers, low energy electron microscopy, LEEM, ptychography, scanning transmission electron microscope, STEM, super-resolution fluorescence microscopy, scanning electron microscopy, SEM, cryo-electron micvroscopy in biology, super.resolution fluorescence microscopy, transmission electron microscopy, TEM, holography, atomic force microscopy, AFM