Handbook of Materials Characterization
Surender Kumar Sharma (Hrsg.)
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Springer International Publishing
Naturwissenschaften, Medizin, Informatik, Technik / Maschinenbau, Fertigungstechnik
Beschreibung
This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.
Kundenbewertungen
Dynamic Light Scattering, Optical Absorption Spectroscopy, X-ray Diffraction (XRD) methods, Photoluminescence and electronic Spectroscopy, X-ray Absorption Spectroscopy, Electron Microscopy, Mössbauer Spectroscopy, Scanning Force Microscopy, Dielectric and Impedance Spectroscopy