Lock-in Thermography
Martin C. Schubert, Otwin Breitenstein, Wilhelm Warta, et al.
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Springer International Publishing
Naturwissenschaften, Medizin, Informatik, Technik / Elektrizität, Magnetismus, Optik
Beschreibung
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
Kundenbewertungen
Shunt Imaging, Electronic Device Failure Analysis, Illuminated LIT applied to solar cells, Non-thermal LIT lifetime mapping, IC Failure Analysis, LIT application to spin caloritronics problems, Trap Density Mapping, Solar Cell Characterization, Power devices for electric cars