Field Emission Scanning Electron Microscopy

New Perspectives for Materials Characterization

Hendrix Demers, Nicolas Brodusch, Raynald Gauvin, et al.

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Springer Singapore img Link Publisher

Naturwissenschaften, Medizin, Informatik, Technik / Maschinenbau, Fertigungstechnik

Beschreibung

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

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Schlagwörter

Low voltage SEM, Dual in-lens electron detection, Field emission gun technologies, Dark-Field Imaging, Ionic liquid treatment, Electron Channeling Contrast Imaging, Magnetic domain imaging, Electron Backscatter Diffraction, Silicon drift detector, X-ray imaging