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Circadian Rhythms for Future Resilient Electronic Systems

Accelerated Active Self-Healing for Integrated Circuits

Mircea R. Stan, Xinfei Guo

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Springer International Publishing img Link Publisher

Naturwissenschaften, Medizin, Informatik, Technik / Elektronik, Elektrotechnik, Nachrichtentechnik

Beschreibung

This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level.  The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery.  Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models.  

  • Presents novel techniques, tested with experiments on real hardware;
  • Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;
  • Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;
  • Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;
  • Includes coverage of resilient aspects of emerging applications such as IoT.

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Schlagwörter

CMOS devices and interconnect recovery, Circuit design for reliability, Electromigration Inside Logic Cells, Reliability of Nanoscale Circuits and Systems, Bias temperature instability for devices and circuits